Sorry, the search criteria can not be empty
Search
View All Categories
Seasonal Sale! As usual see

Metrology System offers non-destructive, 3D surface profiling.

02/15/2015 18:39:11

Combining lateral resolution up to 140 nm via confocal microscopy and vertical resolution up to 0.1 nm with interferometry, Leica DCM8 provides surface analysis of materials and components. Instrument is also suitable for color documentation of samples. Wide choice of Leica objectives, together with 4 LED light sources and integrated CCD camera, deliver true-to-life color images. With XY topography-stitching mode, users can obtain seamless, precise model of larger area.