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  • Product Overview

The 4141B DC source/monitor is designed for use as a system component in user-designed semiconductor I-V or DC parametric test systems. It features a wide DC measurement range, high resolution, high-speed measurement capabilities, remote sensing, and high accuracy.

Four source/monitor units coupled with two voltage-source units, two voltage monitor units, and one ground unit make the 4141B equivalent to 21 instruments. A stand-alone instrument capable of measuring dc parameters, the 4141B features high resolution measurements (50 fA/100 µV) and a built-in timing controller. Typical time for a current or voltage measurement, which includes data transfer, is approximately 25 ms. A swept measurement (51 points) takes approximately 490 ms.

  • Source and monitor units: 4 channels. Each source and monitor unit can be programmed to source voltage and monitor current, or conversely to source current and monitor voltage
    • Voltage range: ±20 V, ±40 V, ±100 V
    • Voltage resolution: 1 mV, 2 mV, 5 mV
    • Current range: ±1000 pA to ±100 mA
    • Current resolution: 1 pA to 10 µA
    • Output/measurement resolution: Voltage: 4½ digits; Current: 4 digits
  • Voltage source units: 2 channels
    • Output voltage range: ±20 V
    • Resolution: 1 mV
  • Voltage monitor units: 2 channels
    • Measurement voltage range: ±2 V, ±20 V
    • Resolution: 100 µV, 1 mV
  • Ground unit: 1 channel; Current range: ±500 mA 
Status Discontinued

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