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The HP 4145B semiconductor parameter analyzer is a fully automatic, high performance, programmable test instrument designed to measure, analyze, and graphically display the DC characteristics of a wide range of semiconductor devices, such as diodes, bipolar transistors, field-effect transistors, wafers, and ICs. Main applications include computer-aided design (CAD) of ICs, new device evaluation, materials evaluation, component selection for circuit design, incoming/outgoing inspection, semiconductor process control, quality control, and quality assurance. The unit is equipped with four programmable Source/Monitor units (SMU), two programmable voltage source units (Vs), two voltage monitor units (Vm), a fully interactive graphics display, removable flexible-disc storage, softkeys, full arithmetic keyboard, and HP-IB. And it can be used on the bench or as part of a complete measurement system in the laboratory or on the production line. For device stimulation and characteristics measurement, the 4145B has eight channels. Channels 1 through 4 are Source/Monitor units (SMU); channels 5 and 6 are voltage source units (Vs); and channels 7 and 8 are voltage monitor units (Vm). Each SMU channel has three modes of operation: voltage source/current monitor (V), current source/voltage monitor (I), and common (COM). Source voltage and source current can be held constant or swept linearly or logarithmically. Measurement results, measurement setups, operator prompts, error messages, and diagnostics are displayed on a fully interactive, microprocessor based graphics display. Measurement results can be displayed in one of four modes: graphic, list, matrix, and schmoo. Front Panel softkeys provide a wide range of automatic display control functions, such as AUTO SCALE, STORE, RECALL, CURSOR, MARKER, vertical and horizontal ZOOM, LINE (two), GRAD, l/GRAD, X intercept, Y intercept, and INTERPOLATE. Softkeys are used in all phases of instrument operation--from measurement setup to measurement analysis--and make overall instrument operation quick and easy. The 4145B is fluent in HP-GL (Hewlett- Packard Graphics Language), permitting external control of its display via the HP-IB. Cursor and marker positioning is user controllable via the front panel, and X-Yl-Y2 coordinates are digitally displayed on the CRT. The 4145B is equipped with a micro flexible-disc drive unit that accommodates a singlesided, double-density, 3.5 inch, 630K byte disc. One system disc that contains the necessary operating system software, four general purpose measurement programs, and 573K bytes of user area is furnished with the 4145B. Provided with the 4145B is the 16058A, a specially designed shielded test fixture that connects to the rear panel of the 4145B. Eight different interchangeable DUT boards are provided, allowing measurement of diodes, 3-terminal and 4-terminal transistors, 8-pin, l0-pin, and 12-pin devices, and 18-pin and 24-pin DIP ICs.
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