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Tencor P-20 Profilometer by SitekProcess
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Product Description
KLA Tencor P-20 Profilometer* Long Scan Profiler Measurement of vertical features.
* Measurement of vertical features ranging from under 100A to approximately 0.3 mm with a vertical resolution of 1 or 25.
* Ability to fit and level data, allowing accurate measurements on curved surfaces * Handles wafers from 3" to 8"
* 2-D and 3-D plots and contour maps
* Full 8" scanning
System is Excellent condition
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